Single Event Effects Radiation Hardened by Design for DC-DC Converter Based on Automatic Detection and Dynamic Compensation

Abstract

The boost converter is taken as an example to analyze the sensitivity of DC-DC converter to single-event transient, and the influence of single-event transient on the loop response is studied. Based on the analysis of loop sensitive nodes, the single-particle energy is obtained in time by the on-chip automatic detection method at the circuit and system level, and then converted into parameters for dynamic compensation, realizing the improvement of transient characteristics under different single-particle energies. Using the method in this work, the circuit design, layout design and physical verification of a highly reliable Boost converter based on a commercial 0.18$\mu$m BCD process are completed. The experimental results show that the input voltage is $2.9\mathrm{V} \sim 4.5\mathrm{V}$, the output voltage is $5.9\mathrm{V} \sim 7.9\mathrm{V}$, and the load capacity is 55mA.Under the action of the single-particle transient effect, the maximum fluctuation of the output voltage does not exceed a ripple voltage, and the suppression ability reaches more than 86.07%, which can resist the single-particle bombardment of LET= $100MeV\cdot cm^{2} /$mg.