A new test scheduling algorithm for VLSI systems

[1991] Proceedings. Fourth CSI/IEEE International Symposium on VLSI Design Pub Date : 1991-01-04 DOI:10.1109/ISVD.1991.185108

M. Garg, A. Basu, T. C. Wilson, D. Banerji, J. Majithia

引用次数: 11

Abstract

Presents a new test scheduling algorithm based on a new heuristic approach. A new concept of time zone tree has been proposed and the algorithm builds up the tree based on a heuristic cost function. The performance of the algorithm has been compared with existing algorithms and it demonstrates encouraging results.<>

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一种新的VLSI系统测试调度算法

提出了一种新的基于启发式方法的测试调度算法。提出了一种新的时区树的概念，该算法基于启发式成本函数构建时区树。将该算法的性能与现有算法进行了比较，取得了令人鼓舞的结果。

本文章由计算机程序翻译，如有差异，请以英文原文为准。

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来源期刊

[1991] Proceedings. Fourth CSI/IEEE International Symposium on VLSI Design

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