Polarization: singular flaw detection of the microstructure of optically transparent polycarbonate layers

Abstract

The article presents the results of determining the possibilities of the polarization-singular approach to improve the efficiency of Mueller-matrix polarimetry in the differential diagnosis of polycrystalline structure of optically transparent polycarbonate layers. The relationship between the characteristic values of the elements of the Mueller matrix and polarization-singular L - states of microscopic images of polycrystalline structure of optically transparent polycarbonate layers was determined. A technique for the experimental determination of the distributions of the characteristic values of Mueller-matrix images has been developed and tested. Statistical criteria for express differential diagnosis of polycrystalline structure of optically transparent polycarbonate layers with different mechanical stresses were determined.