LNA circuit design counting the interconnect line parasitics

Rachid Hamani, C. Andrei, B. Jarry, Mien Lintignat
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引用次数: 1

Abstract

This paper, presents a 24GHz Amplifier circuit demonstrator designed and fabricated in 0.25μm BiCMOS mature technology from NXP Semiconductors in order to evaluate the effect of the interconnect lines on impedance matching. It features 11 dB of gain, 7.6 dB of noise figure (NF) at the working frequency. The input/output impedances are matched close to 50 Ohm with an input return loss of-12 dB and output return loss of about -13 dB. The matching methodology is improved by considering the interconnect lines (from the Layout view) in the matching networks. Schematic circuit simulations and measurements are used to evaluate the amplifier circuit performances. The results are presented here and show a good agreement between both, measurements and simulations.
计算互连线寄生的LNA电路设计
为了评估互连线对阻抗匹配的影响,采用NXP公司0.25μm BiCMOS成熟技术设计制作了24GHz放大器电路演示器。在工作频率下,增益为11 dB,噪声系数(NF)为7.6 dB。输入/输出阻抗匹配接近50欧姆,输入回波损耗为12 dB,输出回波损耗约为-13 dB。通过考虑匹配网络中的互连线(从布局视图),改进了匹配方法。通过原理图电路仿真和测量来评估放大电路的性能。本文给出了实验结果,结果表明测量和模拟结果吻合良好。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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