Annealing effects on flexible multi-layered parylene-based sensors

Brian J. Kim, E. Washabaugh, E. Meng
{"title":"Annealing effects on flexible multi-layered parylene-based sensors","authors":"Brian J. Kim, E. Washabaugh, E. Meng","doi":"10.1109/MEMSYS.2014.6765768","DOIUrl":null,"url":null,"abstract":"To mitigate long term, soaking-induced delamination failure of multi-layered Parylene C devices, a post-process annealing step can be employed to increase adhesion between the Parylene layers. However, it has been shown that annealing of Parylene thin films can alter the bulk properties of the polymer, and thus impact final device performance. To elucidate these effects, the mechanical and electrochemical properties, and sensing performance of untreated and annealed Parylene C-platinum electrochemical impedance-based force sensors were compared. Annealing reduced the height (~3%) and increased the stiffness of the Parylene C sensing channel structure (~1.6x), affecting the sensor's mechanical response. Furthermore, the electrode surface was smoothed as built-in residual stresses were removed during annealing, altering the sensor's electrochemical properties. Together, these phenomena resulted in a 24% reduction in sensor sensitivity. These results indicate that heat-based effects cannot be ignored for Parylene-metal device systems, including neural microelectrode implants, and that mechanical and electrochemical properties and performance must be determined after heat treatment, such as annealing and sterilization.","PeriodicalId":312056,"journal":{"name":"2014 IEEE 27th International Conference on Micro Electro Mechanical Systems (MEMS)","volume":"24 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2014-03-13","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"13","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2014 IEEE 27th International Conference on Micro Electro Mechanical Systems (MEMS)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/MEMSYS.2014.6765768","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 13

Abstract

To mitigate long term, soaking-induced delamination failure of multi-layered Parylene C devices, a post-process annealing step can be employed to increase adhesion between the Parylene layers. However, it has been shown that annealing of Parylene thin films can alter the bulk properties of the polymer, and thus impact final device performance. To elucidate these effects, the mechanical and electrochemical properties, and sensing performance of untreated and annealed Parylene C-platinum electrochemical impedance-based force sensors were compared. Annealing reduced the height (~3%) and increased the stiffness of the Parylene C sensing channel structure (~1.6x), affecting the sensor's mechanical response. Furthermore, the electrode surface was smoothed as built-in residual stresses were removed during annealing, altering the sensor's electrochemical properties. Together, these phenomena resulted in a 24% reduction in sensor sensitivity. These results indicate that heat-based effects cannot be ignored for Parylene-metal device systems, including neural microelectrode implants, and that mechanical and electrochemical properties and performance must be determined after heat treatment, such as annealing and sterilization.
柔性多层聚苯乙烯传感器的退火效应
为了减轻长期浸泡引起的多层聚二甲苯器件的分层失效,可以采用后处理退火步骤来增加聚二甲苯层之间的附着力。然而,已经证明,对聚对二甲苯薄膜的退火可以改变聚合物的体积性质,从而影响最终器件的性能。为了阐明这些影响,比较了未经处理和退火的聚对二甲苯c -铂电化学阻抗力传感器的力学和电化学性能以及传感性能。退火降低了聚对二甲苯传感通道结构的高度(~3%),增加了刚度(~1.6倍),影响了传感器的机械响应。此外,由于在退火过程中消除了内置残余应力,电极表面被光滑,改变了传感器的电化学性能。总之,这些现象导致传感器灵敏度降低24%。这些结果表明,包括神经微电极植入物在内的聚苯乙烯-金属器件系统的热基效应不可忽视,机械和电化学性能和性能必须经过热处理(如退火和灭菌)才能确定。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
求助全文
约1分钟内获得全文 求助全文
来源期刊
自引率
0.00%
发文量
0
×
引用
GB/T 7714-2015
复制
MLA
复制
APA
复制
导出至
BibTeX EndNote RefMan NoteFirst NoteExpress
×
提示
您的信息不完整,为了账户安全,请先补充。
现在去补充
×
提示
您因"违规操作"
具体请查看互助需知
我知道了
×
提示
确定
请完成安全验证×
copy
已复制链接
快去分享给好友吧!
我知道了
右上角分享
点击右上角分享
0
联系我们:info@booksci.cn Book学术提供免费学术资源搜索服务,方便国内外学者检索中英文文献。致力于提供最便捷和优质的服务体验。 Copyright © 2023 布克学术 All rights reserved.
京ICP备2023020795号-1
ghs 京公网安备 11010802042870号
Book学术文献互助
Book学术文献互助群
群 号:604180095
Book学术官方微信