Contactless Approaches for the Electronic Device Heating during Radiation Hardness Assurance Tests for Single-Event Effects

2019 19th European Conference on Radiation and Its Effects on Components and Systems (RADECS) Pub Date : 2019-09-01 DOI:10.1109/radecs47380.2019.9745724

Ekaterina N. Nekrasova, Eugeniy V. Mitin, P. Y. Gromov, V. Anashin

引用次数: 0

Abstract

Different approaches to perform the electronic device heating during radiation hardness assurance tests are discussed. A new heating approach based on the use of ceramic infrared heaters is presented along with experimental results.

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单事件效应辐射硬度保证试验中电子器件加热的非接触方法

讨论了在辐射硬度保证试验中对电子器件进行加热的不同方法。结合实验结果，提出了一种基于陶瓷红外加热器的新型加热方法。

本文章由计算机程序翻译，如有差异，请以英文原文为准。

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来源期刊

2019 19th European Conference on Radiation and Its Effects on Components and Systems (RADECS)

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