The performance and reliability of a new plated copper technology on ceramic

J. Fudala, M. Beke
{"title":"The performance and reliability of a new plated copper technology on ceramic","authors":"J. Fudala, M. Beke","doi":"10.1109/ECTC.1990.122324","DOIUrl":null,"url":null,"abstract":"A plated copper-on-ceramic technology that can be characterized as a ceramic PC (printed circuit) board is described. Adhesion of the plated copper on 96% alumina, 99.5% alumina, beryllium oxide, and aluminum nitrate was evaluated using a peel test method. The plated copper technology is shown to surpass previous plated copper processes in performance and reliability.<<ETX>>","PeriodicalId":102875,"journal":{"name":"40th Conference Proceedings on Electronic Components and Technology","volume":"38 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1990-05-20","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"40th Conference Proceedings on Electronic Components and Technology","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ECTC.1990.122324","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 0

Abstract

A plated copper-on-ceramic technology that can be characterized as a ceramic PC (printed circuit) board is described. Adhesion of the plated copper on 96% alumina, 99.5% alumina, beryllium oxide, and aluminum nitrate was evaluated using a peel test method. The plated copper technology is shown to surpass previous plated copper processes in performance and reliability.<>
陶瓷镀铜新工艺的性能和可靠性
描述了一种陶瓷镀铜技术,其特征为陶瓷PC(印刷电路板)板。用剥离试验方法评价了镀铜在96%氧化铝、99.5%氧化铝、氧化铍和硝酸铝上的附着力。镀铜技术在性能和可靠性方面超越了以前的镀铜工艺
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CiteScore
3.10
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0.00%
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