F. Angione, P. Bernardi, R. Cantoro, Nicola Di Gruttola Giardino, D. Piumatti, M. Reorda, D. Appello, V. Tancorre
{"title":"On the integration and hardening of Software Test Libraries in Real-Time Operating Systems","authors":"F. Angione, P. Bernardi, R. Cantoro, Nicola Di Gruttola Giardino, D. Piumatti, M. Reorda, D. Appello, V. Tancorre","doi":"10.1109/LATS58125.2023.10154492","DOIUrl":null,"url":null,"abstract":"The performance and complexity of Automotive System-on-Chip (SoC) have dramatically risen in the last decade thanks to technology scaling and moved to multicore capabilities. As a matter of fact, user requirements and the scenario complex-ity handled by devices are dramatically growing. Therefore, bare-metal safety-critical applications have shifted to a new application paradigm on top of Real-Time Operating Systems (RTOS). Safety standards require runtime self-check procedures the CPU executes from time to time. Such self-test procedures have strict requirements on their execution time and memory foot-print. The aforementioned self-test processes are also known as Software-Based Self Test encapsulated in Software Test Libraries. Following the shift to applications written on top of an RTOS, Software Test Libraries must also be integrated. This paper investigates possible software architectures when integrating Software Test Libraries in RTOSes with their pros e cons. Afterward, some hardening mechanisms are provided to overcome eventual problems in case permanent or transient faults arise. In order to simulate critical conditions, fault injections are performed via debugger in the Software Test Library to investigate their behavior and how they affect the system. Previously developed Software Test Library is integrated into a commercial RTOS called Micrium C OS-III. The fault injection campaign is performed on a real automotive System-on-Chip belonging to the SPC58 family from ST Microelectronics.","PeriodicalId":145157,"journal":{"name":"2023 IEEE 24th Latin American Test Symposium (LATS)","volume":"17 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2023-03-21","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2023 IEEE 24th Latin American Test Symposium (LATS)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/LATS58125.2023.10154492","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 0
Abstract
The performance and complexity of Automotive System-on-Chip (SoC) have dramatically risen in the last decade thanks to technology scaling and moved to multicore capabilities. As a matter of fact, user requirements and the scenario complex-ity handled by devices are dramatically growing. Therefore, bare-metal safety-critical applications have shifted to a new application paradigm on top of Real-Time Operating Systems (RTOS). Safety standards require runtime self-check procedures the CPU executes from time to time. Such self-test procedures have strict requirements on their execution time and memory foot-print. The aforementioned self-test processes are also known as Software-Based Self Test encapsulated in Software Test Libraries. Following the shift to applications written on top of an RTOS, Software Test Libraries must also be integrated. This paper investigates possible software architectures when integrating Software Test Libraries in RTOSes with their pros e cons. Afterward, some hardening mechanisms are provided to overcome eventual problems in case permanent or transient faults arise. In order to simulate critical conditions, fault injections are performed via debugger in the Software Test Library to investigate their behavior and how they affect the system. Previously developed Software Test Library is integrated into a commercial RTOS called Micrium C OS-III. The fault injection campaign is performed on a real automotive System-on-Chip belonging to the SPC58 family from ST Microelectronics.
在过去十年中,由于技术的扩展和向多核功能的转变,汽车系统芯片(SoC)的性能和复杂性急剧上升。事实上,用户需求和设备处理的场景复杂性正在急剧增长。因此,裸机安全关键型应用程序已经转移到实时操作系统(RTOS)之上的新应用程序范式。安全标准要求CPU不时执行运行时自检程序。这种自测过程对其执行时间和内存占用有严格的要求。前面提到的自测过程也被称为封装在软件测试库中的基于软件的自测。随着向在RTOS上编写应用程序的转变,软件测试库也必须集成。本文研究了在实时操作系统中集成软件测试库时可能的软件架构及其优缺点,然后提供了一些强化机制,以克服出现永久或短暂故障时的最终问题。为了模拟临界条件,通过软件测试库中的调试器执行故障注入,以调查它们的行为以及它们如何影响系统。先前开发的软件测试库被集成到名为microum C OS-III的商业RTOS中。故障注入活动是在ST微电子公司的SPC58系列的真正汽车片上系统上执行的。