A CAD model of Nanoscale Double-Gate MOSFET for RF and Noise applications including quantum and non-stationary effects

A. Lázaro, B. Nae, O. Moldovan, B. Iñíguez
{"title":"A CAD model of Nanoscale Double-Gate MOSFET for RF and Noise applications including quantum and non-stationary effects","authors":"A. Lázaro, B. Nae, O. Moldovan, B. Iñíguez","doi":"10.1109/SCED.2007.384066","DOIUrl":null,"url":null,"abstract":"This paper presents a new approach for an analytical model of nanoscale double-gate (DG) MOSFET. The equivalent circuit is considered over a fully distributed active line, opening the door to obtain a compact and unified small equivalent circuit that includes noise contributions.","PeriodicalId":108254,"journal":{"name":"2007 Spanish Conference on Electron Devices","volume":"27 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2007-07-16","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2007 Spanish Conference on Electron Devices","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/SCED.2007.384066","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
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Abstract

This paper presents a new approach for an analytical model of nanoscale double-gate (DG) MOSFET. The equivalent circuit is considered over a fully distributed active line, opening the door to obtain a compact and unified small equivalent circuit that includes noise contributions.
用于射频和噪声应用的纳米级双栅MOSFET的CAD模型,包括量子和非平稳效应
本文提出了一种建立纳米双栅MOSFET分析模型的新方法。等效电路考虑在完全分布的有源线路上,打开了获得紧凑统一的小型等效电路的大门,其中包括噪声贡献。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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