Fully integrated SOI wavelength meter based on phase shift technique

2015 IEEE 12th International Conference on Group IV Photonics (GFP) Pub Date : 2015-08-01 DOI:10.1109/GROUP4.2015.7305985

A. Ruocco, W. Bogaerts

引用次数: 7

Abstract

We present an MZI (Mach-Zehnder Interferometer) silicon-on-insulator (SOI) wavelength meter. The device integrates photo detectors and modulators. The phase shift between carrier and modulated signal is linearly correlated to the input wavelength.

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基于相移技术的全集成SOI波长计

我们提出了一种MZI(马赫-曾德尔干涉仪)绝缘体上硅(SOI)波长计。该装置集成了光电探测器和调制器。载波和调制信号之间的相移与输入波长呈线性相关。

本文章由计算机程序翻译，如有差异，请以英文原文为准。

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来源期刊

2015 IEEE 12th International Conference on Group IV Photonics (GFP)

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