Time domain analysis of random circuits via combined numerical techniques

Abstract

This paper uses the so called Taylor models and Bernstein polynomials techniques to analyze random circuits affected by uncertain parameters and predict variation of the circuit responses in time domain. It leverages the Bernstein polynomials method to yield a conservative, yet tight, prediction of the circuit response bounds. The method is used and verified in the time-domain analysis of an exemplary linear circuit, which demonstrated its feasibility and strength.