Half-life measurement of 7Be in host beryllium metal

T. Ohtsuki, K. Hirose, K. Ohno, T. Morisato
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Abstract

Abstract The decay rate of an electron-capture nucleus is proportional to the electron density at the nucleus. To see how the decay rate is changed by artificially, we have measured the half-life of7Be in beryllium(Be) metal at room temperature (T=293 K) and at close to the temperature of liquid helium (T=5 K). We found that the half-life of7Be in Be metal at T=293 K is 53.25 ± 0.04 d, which is slightly longer than those in the hosts of graphite, lithium fluoride and other minerals, surveyed so far. Furthermore, that at T=5 K is 53.39 ± 0.04 d, which is 0.26% longer than that at T =293 K.
母体铍金属中7Be的半衰期测定
电子俘获核的衰变速率与原子核上的电子密度成正比。为了了解人为对铍(Be)金属的衰变速率的影响,我们在室温(T=293 K)和接近液氦温度(T=5 K)下测量了铍(Be)金属中的7be在室温(T=293 K)下的半衰期,发现铍(Be)金属中7be在T=293 K下的半衰期为53.25±0.04 d,略长于目前所调查的石墨、氟化锂等矿物中的半衰期。温度为5 K时的反应时间为53.39±0.04 d,比温度为293 K时的反应时间长0.26%。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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