Research on the design of DUT board for the V93000 test system

Zhirong He
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Abstract

DUT board is an interface between the Device Under Test system for the IC test. This paper describes how to design a DUT board based on the test system’s configuration. To enhance the quality of performance on the DUT board, it also focuses on some methods of electrical design about layers distribution, trace routing, signal filtering for mixed-signal, high-speed signal, and special components for the V93000 test system.
V93000测试系统测试板设计研究
DUT板是在被测设备系统之间进行IC测试的接口。本文介绍了如何根据测试系统的配置设计被测板。为了提高测试板的性能质量,重点介绍了V93000测试系统的层分布、走线路由、混合信号滤波、高速信号滤波和专用元器件的电气设计方法。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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