Evaluation of cleaning in electronics production process

M. Bursik, I. Szendiuch, V. Sítko
{"title":"Evaluation of cleaning in electronics production process","authors":"M. Bursik, I. Szendiuch, V. Sítko","doi":"10.1109/ISSE.2009.5207064","DOIUrl":null,"url":null,"abstract":"Cleaning processes used in electronics productions are limited by cleaning efficiency. Those according to physical principle particular cleaning processes limits the area of application of existing system. At the selection of cleaning equipment is very important specification of their efficiency. For this purpose we have developed the quantifiable analyze of contaminated patterns. Evaluating is realized by test pattern on which are applied cleaning processes with different parameters. Next operation is visual controlling of residual contamination. In this way we are capable to determinate the average efficiency of cleaning system, specific efficiency on concrete test pattern and the homogeneity of cleaning efficiency in cleaning chamber. Important for cleaning process is an activity of cleaning medium. The activity of cleaning medium must be over minimum limits. Time intervals are set constant by the parameters of cleaning process especially its activity. For this reason is useful online monitoring of cleaning medium efficiency. This method requires universal sensor of medium activity.","PeriodicalId":337429,"journal":{"name":"2009 32nd International Spring Seminar on Electronics Technology","volume":"161 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2009-05-13","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"2","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2009 32nd International Spring Seminar on Electronics Technology","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ISSE.2009.5207064","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 2

Abstract

Cleaning processes used in electronics productions are limited by cleaning efficiency. Those according to physical principle particular cleaning processes limits the area of application of existing system. At the selection of cleaning equipment is very important specification of their efficiency. For this purpose we have developed the quantifiable analyze of contaminated patterns. Evaluating is realized by test pattern on which are applied cleaning processes with different parameters. Next operation is visual controlling of residual contamination. In this way we are capable to determinate the average efficiency of cleaning system, specific efficiency on concrete test pattern and the homogeneity of cleaning efficiency in cleaning chamber. Important for cleaning process is an activity of cleaning medium. The activity of cleaning medium must be over minimum limits. Time intervals are set constant by the parameters of cleaning process especially its activity. For this reason is useful online monitoring of cleaning medium efficiency. This method requires universal sensor of medium activity.
电子产品生产过程的清洁评价
电子产品中使用的清洗工艺受到清洗效率的限制。那些根据物理原理进行的特殊清洗工序限制了现有系统的应用范围。在选择清洗设备时,规范其效率是非常重要的。为此,我们开发了污染模式的可量化分析。通过试验模式对不同参数的清洗工艺进行评价。下一步是目视控制残留污染。由此可以确定清洗系统的平均效率、混凝土试验图上的比效率以及清洗室内清洗效率的均匀性。清洗过程中重要的一项活动是清洗介质。清洗介质的活度必须超过最低限度。时间间隔是由清洗过程的参数,特别是其活动性设定恒定的。因此在线监测清洗介质的效率是有用的。这种方法需要具有中等活度的通用传感器。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
求助全文
约1分钟内获得全文 求助全文
来源期刊
自引率
0.00%
发文量
0
×
引用
GB/T 7714-2015
复制
MLA
复制
APA
复制
导出至
BibTeX EndNote RefMan NoteFirst NoteExpress
×
提示
您的信息不完整,为了账户安全,请先补充。
现在去补充
×
提示
您因"违规操作"
具体请查看互助需知
我知道了
×
提示
确定
请完成安全验证×
copy
已复制链接
快去分享给好友吧!
我知道了
右上角分享
点击右上角分享
0
联系我们:info@booksci.cn Book学术提供免费学术资源搜索服务,方便国内外学者检索中英文文献。致力于提供最便捷和优质的服务体验。 Copyright © 2023 布克学术 All rights reserved.
京ICP备2023020795号-1
ghs 京公网安备 11010802042870号
Book学术文献互助
Book学术文献互助群
群 号:481959085
Book学术官方微信