L. Entrena, M. García-Valderas, A. Lindoso, M. Portela-García, E. S. Millán
{"title":"Fault Injection Methodologies","authors":"L. Entrena, M. García-Valderas, A. Lindoso, M. Portela-García, E. S. Millán","doi":"10.1007/978-3-030-04660-6_6","DOIUrl":null,"url":null,"abstract":"","PeriodicalId":403600,"journal":{"name":"Radiation Effects on Integrated Circuits and Systems for Space Applications","volume":"59 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1900-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"2","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"Radiation Effects on Integrated Circuits and Systems for Space Applications","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1007/978-3-030-04660-6_6","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
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