On the contact resistance of single-walled carbon nanotubes in RF devices

Abstract

Estimating the contact resistance and losses of Carbon-Nanotubes based devices is a challenging task. This work presents an effective model to calculate the contact resistance of single-walled carbon nanotube-based RF devices. The model realistically incorporates operational parameters beyond the quantum limits and it makes it feasible to implement the model in commercially-adopted COMSOL simulators. Hence, it can be extended to design large scale integrated circuits realistically.