Reliability Analysis

Abstract

As the integration of components are increasing from VLSI to ULSI level. This may lead to damage of electronic system because each component has its own operating characteristics and conditions. So, health prognostic techniques are used that comprise a deep insight into failure cause and effects of all the components individually as well as an integrated technique. It will raise alarm, in case health condition, of the components drift from the desired outcomes. From toy to satellite and sand to silicon, the major key constraint of designing and manufacturing industry are towards enhanced operating performance at less operating time. As the technology advances towards high-speed and low-cost gadgets, reliability becomes a challenging issue.