Destructive Single-Events and Latchup in Radiation-Hardened Switching Regulators

2017 17th European Conference on Radiation and Its Effects on Components and Systems (RADECS) Pub Date : 2017-10-01 DOI:10.1109/RADECS.2017.8696237

Sergeh Vartanian, G. Allen, F. Irom, L. Scheick, S. Hart, N. V. Vonno, L. Pearce

引用次数: 3

Abstract

Single-event destructive behavior and latchup has been observed in two separate radiation-hardened switching regulators. We discuss the test conditions and observed results.

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辐射强化开关稳压器中的破坏性单事件和闭锁

在两个单独的辐射硬化开关调节器中观察到单事件破坏行为和闭锁。讨论了试验条件和观察结果。

本文章由计算机程序翻译，如有差异，请以英文原文为准。

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来源期刊

2017 17th European Conference on Radiation and Its Effects on Components and Systems (RADECS)

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