The Chemistry of Failure Analysis

M. Jacques
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引用次数: 8

Abstract

This paper discusses the chemistry of failure analysis in sufficient detail to serve as a practical guide for the failure analyst. It includes a discussion of the chemistry of plastic composition formulation. This discussion is preparatory to the main body of the paper which covers the chemistry and mechanics of decapsulation and, also, an explanation of the principles of chemical etch of semiconductor building blocks and interconnect materials. Included in the paper is a general procedure of decapsulation and several examples are contained in Table 1. Source materials are cited that will provide additional information on actual decapsulation procedures for thermoplastics and single and composite thermo-setting encapsulation systems. The list of chemicals employed in failure analysis has evolved over the years into a rather impressive list of toxic and extremely dangerous organic and inorganic chemicals. These chemicals when mixed in the proper proportions and used in appropriate environmental conditions are capable of selectively removing plastic encapsulations and semiconductor building blocks to uncover semiconductor failure mechanisms. The safe use of these chemicals and others that may be presented in the future can and will provide the analyst with an excellent tool for determining the precise cause of failure.
失效分析的化学原理
本文充分详细地讨论了失效分析的化学性质,为失效分析人员提供了实用的指导。它包括对塑料成分配方的化学讨论。本文的主要内容包括解封装的化学和力学,以及半导体构建块和互连材料的化学蚀刻原理的解释。本文包含了解封装的一般程序,表1中包含了几个例子。引用的原始材料将提供关于热塑性塑料和单一和复合热固性封装系统的实际解封装程序的额外信息。多年来,用于故障分析的化学品清单已经演变成一份相当令人印象深刻的有毒和极其危险的有机和无机化学品清单。当这些化学物质以适当的比例混合并在适当的环境条件下使用时,能够选择性地去除塑料封装和半导体构建块,从而揭示半导体失效机制。这些化学物质的安全使用以及将来可能出现的其他化学物质可以并且将为分析人员提供确定故障精确原因的极好工具。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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