Message from the Mutation 2017 Chairs

Abstract

It is our pleasure to welcome you to the 12th edition of the International Workshop on Mutation Analysis (Mutation 2017), collocated with the 10th IEEE International Conference on Software Testing, Verification and Validation (ICST 2017) in Tokyo, Japan. Since its first edition, the Mutation workshop has provided a forum to bring together researchers and practitioners, enabling them to exchange ideas, address fundamental challenges in mutation testing, and discuss new applications of mutation.