Interval test method for fault location of the analog circuit with element tolerance

Abstract

The theory of interval algebra has been used for tolerance analysis in circuit design in recent years, but not yet applied to fault diagnosis. In this paper the authors present an interval test method for fault location of analog circuits with tolerance (DC linear or nonlinear). The method is based on the theory of interval analysis. The advantage of this method is that it is simple, intuitive and easy to compute.<>