{"title":"Trench Isolation Schemes for Bipolar Devices --- Benefits and Limiting Aspects","authors":"H. Goto, K. Inayoshi","doi":"10.1007/978-3-642-74360-3_4","DOIUrl":null,"url":null,"abstract":"","PeriodicalId":347756,"journal":{"name":"ESSDERC '87: 17th European Solid State Device Research Conference","volume":"23 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1987-09-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"2","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"ESSDERC '87: 17th European Solid State Device Research Conference","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1007/978-3-642-74360-3_4","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}