Anisotropy of electron mobility in arbitrarily oriented FinFETs

F. Gámiz, L. Donetti, N. Rodriguez
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引用次数: 14

Abstract

We simulated the behavior of electron mobility and the effect of volume inversion in FinFETs with different surface (hkl) orientations and channel directions, using a Monte Carlo simulator. For each surface orientation, different channel directions were also considered. In the case of the (110) surface, a strong anisotropy of electron mobility with channel direction was seen: when the channel was in the (110)/<001> direction, electron mobility was 50% higher than in (110)/<1-10>, and was similar to the mobility for a (100)/<001> direction. This anisotropic behavior with channel orientation was not observed in the (100)-or (111)-surface orientations. The study with silicon thickness also revealed some interesting consequences of the volume inversion effect.
任意定向finfet中电子迁移率的各向异性
我们使用蒙特卡罗模拟器模拟了不同表面(hkl)取向和通道方向的finfet中电子迁移率的行为和体积反转的影响。对于每个表面方向,还考虑了不同的通道方向。在(110)表面,电子迁移率随通道方向的各向异性很强:当通道在(110)/方向时,电子迁移率比在(110)/方向高50%,与(100)/方向的迁移率相似。这种各向异性行为在(100)或(111)表面取向中没有观察到。对硅厚度的研究还揭示了体积反转效应的一些有趣结果。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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